Titlebook: Analog IC Reliability in Nanometer CMOS; Elie Maricau,Georges Gielen Book 2013 Springer Science+Business Media New York 2013 Analog Circui

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Integrated Circuit Reliability,, aging effects become more important for circuits integrated in sub-45?nm technologies (see Chap.?2). To guarantee circuit reliability over a product’s lifetime, a foundry typically performs accelerated stress measurements on individual devices and calculates the maximum transistor operating voltag

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Conclusions,istor aging effects have been studied and compact models for each important effect have been developed. Also, a circuit reliability simulation flow has been proposed. Finally, the flow has been applied to a set of analog circuits and the impact of aging has been studied.

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Heribert Meffert,Ralf Birkelbachy CMOS technology downscaling is needed to meet requirements on speed, complexity, circuit density, power consumption and ultimately cost required by many advanced applications. However, going to these ultra-scaled CMOS devices also brings some drawbacks.

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依法逮捕

Analog IC Reliability Simulation,c aging effects become more and more important. On top of that, most academic and commercial simulators are limited to the simulation of rather small circuits. Accurate reliability evaluation of large analog or mixed-signal circuits is therefore still not possible.

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