Titlebook: Analog IC Reliability in Nanometer CMOS; Elie Maricau,Georges Gielen Book 2013 Springer Science+Business Media New York 2013 Analog Circui

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Heribert Meffert,Ralf Birkelbach for semiconductors 2011). This trend is driven by a seemingly unending demand for ever-better performance and by fierce global competition. The steady CMOS technology downscaling is needed to meet requirements on speed, complexity, circuit density, power consumption and ultimately cost required by

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Heribert Meffert,Ralf Birkelbacht performance at design time. This results in huge savings in development costs and enables a designer to maximize the performance of his or her circuit in a particular technology. Over time, computer-aided design (CAD) software has become more complex and more and more aspects related to IC develop

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https://doi.org/10.1007/978-3-322-91158-2implementation of a reliability simulation framework in each of the major commercial SPICE simulators, there are still a lot of deficiencies remaining (also see Sect.?4.4). Especially with the evolution to ever-smaller CMOS devices, statistical effects resulting from process variations and stochasti

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https://doi.org/10.1007/978-3-322-91158-2, aging effects become more important for circuits integrated in sub-45?nm technologies (see Chap.?2). To guarantee circuit reliability over a product’s lifetime, a foundry typically performs accelerated stress measurements on individual devices and calculates the maximum transistor operating voltag

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Heribert Meffert,Ralf Birkelbachistor aging effects have been studied and compact models for each important effect have been developed. Also, a circuit reliability simulation flow has been proposed. Finally, the flow has been applied to a set of analog circuits and the impact of aging has been studied.

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Analog IC Reliability Simulation,implementation of a reliability simulation framework in each of the major commercial SPICE simulators, there are still a lot of deficiencies remaining (also see Sect.?4.4). Especially with the evolution to ever-smaller CMOS devices, statistical effects resulting from process variations and stochasti