Titlebook: Wafer Scale Integration; Earl E. Swartzlander Book 1989 Kluwer Academic Publishers 1989 Programmable Logic.Signal.Software.VLSI.Wafer.comp

miracle

Wafer-Scale Testing/Design for Testability,ies. As digital systems become more complex, they are characterized by more internal circuitry per I/O line and larger internal state spaces. This makes testing complex systems as integrated units very difficult. The testing problem can be made more tractable by partitioning them into subsystems tha

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無能力之人

cuticle

The 3-D Computer: An Integrated Stack of WSI Wafers,pany higher levels of integration have been the driving constraints. In virtually all instances, though, the end goal has been the same: increase the packaging density of the active electronic elements.

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誘惑

afer with hundreds of identical circuits, testing the circuits, dicing the wafer, and packaging the good dice. In contrast in WSI, a wafer is fabricated with several types of circuits (generally referred to as cells), with multiple instances of each cell type, the cells are tested, and good cells ar