Titlebook: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge; G. M?llenstedt,K. H. Gaukler Book 19

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書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge影響因子(影響力)




書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge影響因子(影響力)學(xué)科排名




書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge網(wǎng)絡(luò)公開度




書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge被引頻次




書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge被引頻次學(xué)科排名




書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge年度引用




書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge年度引用學(xué)科排名




書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge讀者反饋




書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge讀者反饋學(xué)科排名

aerobic

Arctic

http://image.papertrans.cn/v/image/985098.jpg

Coordinate

https://doi.org/10.1007/978-3-662-24778-5Dichte; Elektronen; Energie; Kohlenstoff; Legierungen; Mineral; Neuron; Optik; Ordnungszahl; Phase; Phasen; R?n

自作多情

Acupressure

Grazing Incidence X-Ray Telescopesto develop high resolution telescopes for studying X-ray emission from the sun and from other celestial X-ray sources. The systems which we have developed are based on the fact that X-rays are reflected with high efficiencies only at grazing angles of incidence.

整潔漂亮

萬神殿

Peak to Background Ratio in Microprobe Analysisae are derived for the fundamental peak to background ratio, assuming that the continuous X-ray spectrum is the only source of background. The effect of the spectrometer resolution and natural line width is considered. Some experimental data for the Cr .. and Cd .. lines are compared with theory.

語源學(xué)

FECK