Titlebook: VLSI-SoC: New Technology Enabler; 27th IFIP WG 10.5/IE Carolina Metzler,Pierre-Emmanuel Gaillardon,Ricard Conference proceedings 2020 IFIP

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stratum-corneum

1868-4238 y Large Scale Integration, VLSI-SoC 2019, held in Cusco, Peru, in October 2019...The 15 full papers included in this volume were carefully reviewed and selected from the 28 papers (out of 82 submissions) presented at the conference. The papers discuss the latest academic and industrial results and d

Monolithic

Software-Based Self-Test for Delay Faults,utomatically generated test patterns. However, functional approaches are often used to complement test suites. Software-Based Self-Test (SBST) can be used to increase defect coverage in microcontrollers, to replace part of the scan pattern set to reduce tester requirements, or to complement the defe

acrimony

On Test Generation for Microprocessors for Extended Class of Functional Faults,arge class of high-level functional faults. This is comparable to that used in memory testing which also covers a large class of structural faults such as stuck-at-faults (SAF), conditional SAF, multiple SAF and bridging faults. The approach is fully high-level, the model of the microprocessor is de

憤慨一下

Robust FinFET Schmitt Trigger Designs for Low Power Applications,ability impact. Given the broad set of IoT devices running on battery-oriented environments, energy consumption should be minimal and the operation reliable. Schmitt Trigger inverters are frequently used for noise immunity enhancement, and have been recently applied to mitigate radiation effects and

易彎曲

An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults,ificant performance and area penalties, especially when a design with fault-tolerant structure is overprotected. There are several estimation methods, as Probabilistic Transfer Matrix, Signal Probability Reliability, and SPR Multi-Pass, to evaluate circuit reliability. Theses methods use probabilist

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