| 書目名稱 | VLSI Design for Manufacturing: Yield Enhancement |
| 編輯 | Stephen W. Director,Wojciech Maly,Andrzej J. Stroj |
| 視頻video | http://file.papertrans.cn/981/980090/980090.mp4 |
| 叢書名稱 | The Springer International Series in Engineering and Computer Science |
| 圖書封面 |  |
| 描述 | One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our mo |
| 出版日期 | Book 1990 |
| 關鍵詞 | PROM; Phase; Software; VLSI; computer; integrated circuit; manufacturing; model; modeling; production; simulat |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4613-1521-6 |
| isbn_softcover | 978-1-4612-8816-9 |
| isbn_ebook | 978-1-4613-1521-6Series ISSN 0893-3405 |
| issn_series | 0893-3405 |
| copyright | Kluwer Academic Publishers 1990 |
|Archiver|手機版|小黑屋|
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