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Titlebook: VLSI Design and Test for Systems Dependability; Shojiro Asai Book 2019 Springer Japan KK, part of Springer Nature 2019 CREST Program.Error

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51#
發(fā)表于 2025-3-30 10:38:16 | 只看該作者
52#
發(fā)表于 2025-3-30 16:00:34 | 只看該作者
ontributes to a better understanding of threats against safe.This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems..The book consists of three parts. Part I, a
53#
發(fā)表于 2025-3-30 17:55:51 | 只看該作者
54#
發(fā)表于 2025-3-30 23:42:34 | 只看該作者
55#
發(fā)表于 2025-3-31 02:45:13 | 只看該作者
Design and Development of Electronic Systems for Quality and Dependabilityction to the rest of this book. Setting a good goal for a development is not simple to begin with, and the task to get there is often more demanding than it appears at the beginning. The importance of project management and role played by the project manager is first pointed out along with the need
56#
發(fā)表于 2025-3-31 05:18:50 | 只看該作者
Radiation-Induced Soft Errors on the terrestrial electronic systems in the variety of industries. Mitigation measures, taken at various levels of design hierarchy from physical to systems level against neutron-induced adverse effects, are then introduced. Challenges for retaining robustness under future technology development a
57#
發(fā)表于 2025-3-31 11:13:49 | 只看該作者
Electromagnetic Noisesinterfere with other circuits on the same chip or in another chip. Circuits and systems performance may be unpredictably and dynamically degraded by EM noise through its impacts on power and signal integrity.This chapter discusses the state-of-the-art knowledge and countermeasures associated with su
58#
發(fā)表于 2025-3-31 15:05:57 | 只看該作者
59#
發(fā)表于 2025-3-31 20:15:20 | 只看該作者
Time-Dependent Degradation in Device Characteristics and Countermeasures by Design on the other hand, has been unavoidably compromised through the introductions of new materials, new process technologies, etc. Mitigating measures against transient degradation of circuit performance are now what all circuit designers should know. In this chapter, techniques to monitor device degra
60#
發(fā)表于 2025-4-1 00:37:27 | 只看該作者
Connectivity in Wireless Telecommunicationsso far been paid to providing broader bandwidth for rapidly expanding subscriber base. In this chapter, the connectivity of wireless telecommunication is undertaken as a central issue, while keeping in mind that the next-generation wireless will take on broader and ubiquitous machine-to-machine (M2M
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