| 書目名稱 | Transmission Electron Microscopy and Diffractometry of Materials | | 編輯 | Brent Fultz,James M. Howe | | 視頻video | http://file.papertrans.cn/929/928995/928995.mp4 | | 概述 | Designed to meet the needs of materials scientists, including students, teachers and researchers.Can be used as both an introductory and advanced level graduate text.Chapters are sorted according to d | | 圖書封面 |  | | 描述 | We are delighted by the publication of this second edition by Springer-Verlag, now in its second printing. The first edition took over twelve years to com- plete, but its favorable acceptance and quick sales prompted us to prepare the second edition in about two years. The new edition features many re-writings of explanations to improve clarity, ranging from substantial re-structuring to subtle re-wording. Explanations of modern techniques such as Z-contrast imaging have been updated, and errors in text and figures have been cor- rected over the course of several critical re-readings. The on-line solutions manual has been updated too. The first edition arrived at a time of great international excitement in nanostructured materials and devices, and this excitement continues to grow. The second edition, with new examples and re-writing, shows better how nanostructures offer new opportunities for transmission electron microscopy and diffractometry of materials. Nevertheless, the topics and structure of the first edition remain intact. The aims and scope of the book remain the same, as do our teaching suggestions. We thank our physics editors Drs. Claus Ascheron and Angela Lahee, and o | | 出版日期 | Textbook 20022nd edition | | 關(guān)鍵詞 | Helium-Atom-Streuung; Powder diffraction; X-Ray; crystal; crystallography; diffraction; electron diffracti | | 版次 | 2 | | doi | https://doi.org/10.1007/978-3-662-04901-3 | | isbn_ebook | 978-3-662-04901-3 | | copyright | Springer-Verlag Berlin Heidelberg 2002 |
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