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Titlebook: Single-Event Effects, from Space to Accelerator Environments; Analysis, Prediction Ygor Quadros de Aguiar,Frédéric Wrobel,Rubén Garcí Book‘

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發(fā)表于 2025-3-21 16:37:32 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Single-Event Effects, from Space to Accelerator Environments
副標題Analysis, Prediction
編輯Ygor Quadros de Aguiar,Frédéric Wrobel,Rubén Garcí
視頻videohttp://file.papertrans.cn/886/885228/885228.mp4
概述Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies.Addresses failure mechanisms, known as single-event effects (SEEs), and
圖書封面Titlebook: Single-Event Effects, from Space to Accelerator Environments; Analysis, Prediction Ygor Quadros de Aguiar,Frédéric Wrobel,Rubén Garcí Book‘
描述.This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described...Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA... .Describes both the fundamental concepts underlying radiation effects in elec
出版日期Book‘‘‘‘‘‘‘‘ 2025
關鍵詞Soft Errors from Particle to Circuits; Single Event Effects in Aerospace; Radiation Effects on Integra
版次1
doihttps://doi.org/10.1007/978-3-031-71723-9
isbn_softcover978-3-031-71725-3
isbn_ebook978-3-031-71723-9
copyrightThe Editor(s) (if applicable) and The Author(s) 2025
The information of publication is updating

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Radiation Environment and Their Effects on Electronics,chieve this, it is important to have a solid understanding of different radiation environments and their effects on matter. This chapter aims to provide the necessary foundations to comprehend the dynamics of radiation environments, including space and Earth’s atmosphere, as well as particle acceler
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Single-Event Effect Prediction Methodologies,ld of electronics for understanding the behavior of MOS transistors. Likewise, in the investigation of electronic components’ susceptibility to radiation effects, numerous models have been developed and documented in the literature to analyze the diverse interaction mechanisms at both the device and
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Radiation Hardening,d hardening techniques to improve the resilience of electronic systems. Considering that the radiation environment and the operation conditions are known, as it will be shown in this chapter, several techniques can be applied to increase the robustness of a circuit. The radiation hardening technique
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Analysis of Circuit-Based RHBD Techniques,ction levels. Here, we evaluate the charge sharing effect, considering its dependence on cell placement and logic synthesis. Subsequently, an optimization methodology is proposed to enhance overall circuit hardness through signal probability–based pin swapping.
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