Titlebook: Sustainable Development in Energy and Environment; Select Proceedings o V. Sivasubramanian,Arivalagan Pugazhendhi,I. Ganes Conference proce

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Subbulakshmi Muthusamy,Sruthilaya Udhayabaskar,Gowthama Prabu Udayakumar,G. B. Kirthikaa,N. Sivarajaaster or PhD level. The prerequisites are a background in probability theory and finite state space Markov chains...Vlad Stefan Barbu is associate professor in statistics at the University of Rouen, France, Laboratory of Mathematics ‘Rapha?l Salem.’ His research focuses basically on stochastic proce

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R. S. A. Sorna Kumar,P. N. Karl J. Samuel,N. Swetha,P. Dhanapriya,Shaleesha A. Stanleyeeing. Sections are I. Markov additive processes and regenerative systems II. Semi-Markov decision processes III. Algorithmic and computer-oriented approach IV. Semi-Markov models in economy and insurance V. Semi-Markov processes and reliability theory VI. Simulation and statistics for semi-Markov p

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Kalimuthu Jawaharraj,Prabu Manoharan,Rathinam Navanietha Krishnaraj,Rathinasamy Karpagam,Balasubramaeeing. Sections are I. Markov additive processes and regenerative systems II. Semi-Markov decision processes III. Algorithmic and computer-oriented approach IV. Semi-Markov models in economy and insurance V. Semi-Markov processes and reliability theory VI. Simulation and statistics for semi-Markov p

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J. Jerold John Britto,A. Vasanthanathan,S. Rajakarunakaran,M. Manikandan,P. Ari Ramalingamnable due to the sometimes unfounded but necessary assumptions that must be imposed concerning the distribution function of the failure time. One way to avoid the above difficulties is to examine the failure mechanism of the given device and thus determine in a proper fashion the form of its distrib

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Suresh Kumar Krishnan,Kavitha Subbiah,Senthilkumar Kandasamy,Kalidass Subramaniamnable due to the sometimes unfounded but necessary assumptions that must be imposed concerning the distribution function of the failure time. One way to avoid the above difficulties is to examine the failure mechanism of the given device and thus determine in a proper fashion the form of its distrib

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Karthikumar Sankar,Shyam Kumar Rajaram,I. Ganesh Moorthy,K. Naresh,S. Vaitheeswaran,R. K. Akash Kumanable due to the sometimes unfounded but necessary assumptions that must be imposed concerning the distribution function of the failure time. One way to avoid the above difficulties is to examine the failure mechanism of the given device and thus determine in a proper fashion the form of its distrib

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P. Bharathi,V. Varsha,S. Gayathriate professor in statistics at the University of Rouen, France, Laboratory of Mathematics ‘Rapha?l Salem.’ His research focuses basically on stochastic proce978-0-387-73171-1978-0-387-73173-5Series ISSN 0930-0325 Series E-ISSN 2197-7186

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J. Jerold John Britto,A. Vasanthanathan,S. Rajakarunakaran,K. Amudhanate professor in statistics at the University of Rouen, France, Laboratory of Mathematics ‘Rapha?l Salem.’ His research focuses basically on stochastic proce978-0-387-73171-1978-0-387-73173-5Series ISSN 0930-0325 Series E-ISSN 2197-7186