Titlebook: Surfaces and Interfaces of Solid Materials; Hans Lüth Textbook 19953rd edition Springer-Verlag Berlin Heidelberg 1995 Solids.material.micr

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0172-6234 aces and heterostructures. Experimental topics covering the basics of ultrahigh-vacuum technology, electron optics, surface spectroscopies and electrical interface characterization techniques are presented in the form of separate panels.978-3-662-03132-2Series ISSN 0172-6234

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Space-Charge Layers at Semiconductor Inferfaces,tors the free-carrier concentrations are usually much lower, on the order of 10. cm. may be, and we thus expect much larger screening lengths, of the order of hundreds of ?ngstroms. These spatial regions of redistributed screening charges are called ..

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PURG

Morphology and Structure of Surfaces and Interfaces,or interface. Structure, on the other hand, is associated more with a microscopic, atomistic picture and will be used to denote the detailed geometrical arrangement of atoms and their relative positions in space.

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Adsorption on Solid Surfaces,eposition of atoms and molecules to yield a second solid phase and thus a new solid/solid interface. In the present chapter we consider the interaction between a solid surface and foreign atoms in a more fundamental way.

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Prologue

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Scattering from Surfaces,t be studied against the background of about 10. atoms present in a bulk volume of one cm.. In surface and interface physics the appropriate geometry for a scattering experiment is thus the reflection geometry. Furthermore, only particles that do not penetrate too deeply into the solid can be used.