Titlebook: Surface-Based Remote Sensing of the Atmospheric Boundary Layer; Stefan Emeis Book 2011 Springer Science+Business Media B.V. 2011 ABL resea

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978-94-007-3321-3Springer Science+Business Media B.V. 2011

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Surface-Based Remote Sensing of the Atmospheric Boundary Layer978-90-481-9340-0Series ISSN 1383-8601 Series E-ISSN 2215-162X

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Stefan EmeisIB.Covers in-situ nanomanipulation of materials.Written by i.Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. .Scanning Microscopy for Nanotechnology. addr

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Stefan EmeisIB.Covers in-situ nanomanipulation of materials.Written by i.Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. .Scanning Microscopy for Nanotechnology. addr

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