| 書目名稱 | Structure and Electronic Properties of Ultrathin In Films on Si(111) |
| 編輯 | Shigemi Terakawa |
| 視頻video | http://file.papertrans.cn/881/880187/880187.mp4 |
| 概述 | Nominated as an outstanding Ph.D. book by Kyoto University.Provides usage and application of various surface science techniques and calculation.Presents beautiful artworks of atomic-resolution STM ima |
| 叢書名稱 | Springer Theses |
| 圖書封面 |  |
| 描述 | .This book reports the establishment of a single-atomic layer metal of In and a novel (In, Mg) ultrathin film on Si(111) surfaces. A double-layer phase of In called “rect” has been extensively investigated as a two-dimensional metal. Another crystalline phase called “hex” was also suggested, but it had not been established due to difficulty in preparing the sample. The author succeeded in growing the large and high-quality sample of the hex phase and revealed that it is a single-layer metal. The author also established a new triple-atomic layer (In, Mg) film with a nearly freestanding character?by Mg deposition onto the In double layer. This work proposes a novel method to decouple ultrathin metal films from Si dangling bonds..The present study demonstrates interesting properties of indium itself, which is a p-block metal both with metallicity and covalency. In this book, readers also see principles of various surface analysis techniques and learn how to use them andanalyze the results in the real systems. This book is useful to researchers and students interested in surface science, particularly ultrathin metal films on semiconductor surfaces.. |
| 出版日期 | Book 2022 |
| 關鍵詞 | Ultrathin Films; 2D Metals; Surface States; ARPES; LEED and STM |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-981-19-6872-3 |
| isbn_softcover | 978-981-19-6874-7 |
| isbn_ebook | 978-981-19-6872-3Series ISSN 2190-5053 Series E-ISSN 2190-5061 |
| issn_series | 2190-5053 |
| copyright | The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapor |
|Archiver|手機版|小黑屋|
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