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Titlebook: Soziale Sprachvariet?ten im niederrheinischen Industriegebiet; Arend Mihm Book 1981 Springer Fachmedien Wiesbaden 1981 5.1.Altes Testament

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31#
發(fā)表于 2025-3-26 23:39:14 | 只看該作者
32#
發(fā)表于 2025-3-27 02:27:08 | 只看該作者
Arend Mihmtery status, etc. [Bran05]. An efficient implementation of these chipsets demands for reconfigurable transceiver blocks that can adjust their circuit parameters to the diverse specifications with adaptive power consumption and at the lowest cost. One of the most challenging building blocks in multi-
33#
發(fā)表于 2025-3-27 07:32:09 | 只看該作者
Arend Mihmsed test methodology, it is common to use transition delay fault model for at-speed testing. The test procedure is to create a transition at a node using scan chains for controllability, capture the results after a time period equal to one system clock cycle, and observe the contents of the scan cha
34#
發(fā)表于 2025-3-27 09:44:38 | 只看該作者
Arend Mihmsigns to supply voltage noise is increasing. The supply noise is much larger during at-speed delay test compared to normal circuit operation since large number of transitions occur within a short time frame. Existing commercial ATPG tools do not consider the excessive supply noise that might occur i
35#
發(fā)表于 2025-3-27 17:16:14 | 只看該作者
Arend Mihmivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density.? With the drastic increase in memory densities, lower supply voltages, and higher variations, statist
36#
發(fā)表于 2025-3-27 18:09:52 | 只看該作者
37#
發(fā)表于 2025-3-27 23:24:59 | 只看該作者
38#
發(fā)表于 2025-3-28 05:55:59 | 只看該作者
39#
發(fā)表于 2025-3-28 08:08:46 | 只看該作者
40#
發(fā)表于 2025-3-28 13:21:41 | 只看該作者
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