Titlebook: Small Particles and Inorganic Clusters; Proceedings of the F Claude Chapon,Marcel F. Gillet,Claude R. Henry Conference proceedings 1989 Spr

Withdrawal

書目名稱Small Particles and Inorganic Clusters影響因子(影響力)




書目名稱Small Particles and Inorganic Clusters影響因子(影響力)學科排名




書目名稱Small Particles and Inorganic Clusters網(wǎng)絡(luò)公開度




書目名稱Small Particles and Inorganic Clusters網(wǎng)絡(luò)公開度學科排名




書目名稱Small Particles and Inorganic Clusters被引頻次




書目名稱Small Particles and Inorganic Clusters被引頻次學科排名




書目名稱Small Particles and Inorganic Clusters年度引用




書目名稱Small Particles and Inorganic Clusters年度引用學科排名




書目名稱Small Particles and Inorganic Clusters讀者反饋




書目名稱Small Particles and Inorganic Clusters讀者反饋學科排名

carotenoids

Anthology

Mere僅僅

Neutralization and matrix deposition experiments on mass-selected silver atoms and clusters Metal cluster cations, produced by Ar. sputtering, may be energy analyzed and then mass selected in a quadrupole mass filter. The clusters are neutralized by low energy electrons and then co-deposited with a rare gas on a 4 K sapphire window. Matrix samples were interrogated in situ by UV-optical a

infantile

涂掉

憤怒事實

HAWK

Size-dependent thermodynamic properties of silver aggregates. Simulation of the photographic developonor whose electrochemical potential is close to those of usual photographic developers. A critical size has to be reached by the silver aggregate before it is thermodynamically able to accept electrons from the donor, then to grow by an autocatalytic process with alternate adsorption of Ag. ions an

Synchronism

Sodium clusters in zeolitesnfluence of the azide loading, the azide decomposition rate and the sintering process on the amount of ionic and metallic sodium clusters in zeolite Y was followed by ESR. The method is compared to other metal deposition techniques.

粗魯性質(zhì)

Minimal spanning tree analysis of regular, random and cluster structuresom a MST it is possible to deduce the average edge length m and the standard deviation σ, which are characteristics for the corresponding distribution. The use of a diagram involving both . and σ makes it possible to determine the degree of order by taking a simple reading in the (., σ) plane. It is