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Titlebook: Simultaneous Switching Noise of CMOS Devices and Systems; Ramesh Senthinathan,John L. Prince Book 1994 Springer Science+Business Media New

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發(fā)表于 2025-3-21 19:40:33 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Simultaneous Switching Noise of CMOS Devices and Systems
編輯Ramesh Senthinathan,John L. Prince
視頻videohttp://file.papertrans.cn/868/867754/867754.mp4
叢書名稱The Springer International Series in Engineering and Computer Science
圖書封面Titlebook: Simultaneous Switching Noise of CMOS Devices and Systems;  Ramesh Senthinathan,John L. Prince Book 1994 Springer Science+Business Media New
描述This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using Bipolar Junction Transistors (BJTs). This present work covers in-depth analysis on estimating SSN and its impact for CMOS based devices and systems. At present semiconductor industries are moving towards scaled CMOS devices and reduced supply voltage. SSN together with coupled noise may limit the packing density, and thereby the frequency of operation of packaged systems. Our goal is to provide efficient and yet reliable methodologies and algorithms to estimate the overall noise containment in single chip and multi-chip package assemblies. We hope that the techniques and results described in this book will be useful as guides for design, package, and system engineers and academia working in this area. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Work reported i
出版日期Book 1994
關(guān)鍵詞bipolar junction transistor; CMOS; design; frequency; logic; modeling; power distribution; semiconductor; si
版次1
doihttps://doi.org/10.1007/978-1-4615-3204-0
isbn_softcover978-1-4613-6406-1
isbn_ebook978-1-4615-3204-0Series ISSN 0893-3405
issn_series 0893-3405
copyrightSpringer Science+Business Media New York 1994
The information of publication is updating

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https://doi.org/10.1007/978-1-4615-3204-0bipolar junction transistor; CMOS; design; frequency; logic; modeling; power distribution; semiconductor; si
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Simultaneous Switching Noise of CMOS Devices and Systems978-1-4615-3204-0Series ISSN 0893-3405
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Introduction,here are n number of output drivers and m number of internal gates switching from logic “1” to logic “0” or vice versa. Because of the condition described by equation (1.1), SSN is often associated solely with the output drivers switching simultaneously.
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Dynamic Noise Immunity, and Skewing/Damping SSN Waveform,ut drivers, but also depend on the package parasitics [6.1]. Unless these power/ground noise fluctuations are controlled, simultaneous switching noise can degrade or even limit the system performance.
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Application Specific Output Drivers to Reduce SSN,vel. Unless power and ground noise are controlled, reliable operation of logic devices that are connected to the same ../.. busses is not guaranteed. Some of the encounted problems with false-operations due to simultaneous switching noise are; 1) false triggering, 2) double clocking, and/or 3) missing clocked pulses [7.1].
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