| 書(shū)目名稱 | Scanning Electron Microscopy |
| 副標(biāo)題 | Physics of Image For |
| 編輯 | Ludwig Reimer |
| 視頻video | http://file.papertrans.cn/862/861148/861148.mp4 |
| 概述 | Main benefit is information about the physics of image formation and microanalysis in scanning electron microscopy.2nd, completely revised and updated edition |
| 叢書(shū)名稱 | Springer Series in Optical Sciences |
| 圖書(shū)封面 |  |
| 描述 | .Scanning Electron Microscopy .provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. |
| 出版日期 | Book 1998Latest edition |
| 關(guān)鍵詞 | Rasterelektronen Mikroskopie; Scanning Tunneling Microscopy; crystal; diffraction; electron microscope; e |
| 版次 | 2 |
| doi | https://doi.org/10.1007/978-3-540-38967-5 |
| isbn_softcover | 978-3-642-08372-3 |
| isbn_ebook | 978-3-540-38967-5Series ISSN 0342-4111 Series E-ISSN 1556-1534 |
| issn_series | 0342-4111 |
| copyright | Springer-Verlag Berlin Heidelberg 1998 |
|Archiver|手機(jī)版|小黑屋|
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