Titlebook: Reliability, Yield, and Stress Burn-In; A Unified Approach f Way Kuo,Wei-Ting Kary Chien,Taeho Kim Book 1998 Springer Science+Business Medi

HAIL

sed-rate

deriver

Abnormal

WAG

https://doi.org/10.1007/978-1-4615-5671-8complexity; defects; design; development; electronics; manufacturing; microelectronics; modeling; production

Mendicant

978-1-4613-7596-8Springer Science+Business Media New York 1998

刺耳

Overview of Design, Manufacture, and Reliability, by the customers, is the most important factor driving this competition. Achieving a competitive level of quality requires leadership from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate state-of-the-art engineering design approaches.

裂隙

Parametric Approaches To Decide Optimal System Burn-in Time,The incompatibility factor introduced in Chapter 6 is elaborated in detail in this chapter. Two different models, the time-independent and the time-dependent models, are presented by applying “compatibility factors,” which are not widely considered elsewhere.

TOXIN

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