Titlebook: Reliability, Safety and Hazard Assessment for Risk-Based Technologies; Proceedings of ICRES Prabhakar V. Varde,Raghu V. Prakash,Gopika Vino

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Reliability, Safety and Hazard Assessment for Risk-Based TechnologiesProceedings of ICRES

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Probabilistic Safety Assessment of a Typical Chemical Process Plantavailable in ISOGRAPH software have been used for component modelling. The events considered in fault tree are failures that are associated with component hardware failures, human errors, maintenance or breakdown unavailability that may lead to undesired state. Standard formats were used for coding

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PSA Level-3 Study—Estimation of Area and Persons Affected for Postulated Accidental Release from Indt of emergency response planning, affected sector and area are determined under variety of meteorological conditions. The protection offered by iodine prophylaxis and sheltering has been emphasized in this study. Sheltering can be effective by keeping the public out of the plume exposure pathway dur

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Shutdown Probabilistic Safety Assessment of Boiling Water Reactorplant operating states. To reduce the effects of dynamic nature, refueling shutdown (RSD) duration is divided into 7 plant operating states (POS) and plant configuration is assumed constant during each POS. Six transients are considered as initiating events (IEs) in this study. For each IE, a separa

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Source-Term Prediction During Loss of Coolant Accident in NPP Using Artificial Neural Networksion state of associated engineered safety features (ESFs). This paper presents an integrated framework based on artificial neural networks (ANNs) for early prediction of the expected release of source term during the large break loss of coolant accident (LOCA) in 220?MWe pressurised heavy water reac

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Time-Dependent Short Mode Failures in MLCCs Due to Cracks in the Device Bodieswhich resulted in short mode failures in ceramic chip capacitors over a period of time due to metal migration. In this paper, controlled experiments were conducted to demonstrate short mode failure in MLCCX7RU capacitors initiated due to cracks developed in them during assembly fabrication. Effect o