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Titlebook: Reliability, Safety and Hazard Assessment for Risk-Based Technologies; Proceedings of ICRES Prabhakar V. Varde,Raghu V. Prakash,Gopika Vino

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樓主: radionuclides
21#
發(fā)表于 2025-3-25 07:21:15 | 只看該作者
Source-Term Prediction During Loss of Coolant Accident in NPP Using Artificial Neural Networks process and safety systems, etc. during its operations. Such transients may eventually result in an abnormal state of the plant, which may have severe consequences if not mitigated. In case of such an undesired plant condition, the chances of the release of source term (e.g. release of Iodine, Caes
22#
發(fā)表于 2025-3-25 10:56:15 | 只看該作者
23#
發(fā)表于 2025-3-25 13:45:20 | 只看該作者
24#
發(fā)表于 2025-3-25 16:01:44 | 只看該作者
Reliability Analysis of Smart Pressure Transmitterignal conditioning and processing functions that are carried out by embedded microprocessors. Smart transmitters generally have the features like self-diagnosis, fault detection, digital communication, etc. However, with the advancement in the features and capabilities, the complexity of the smart t
25#
發(fā)表于 2025-3-25 22:20:18 | 只看該作者
26#
發(fā)表于 2025-3-26 01:18:20 | 只看該作者
Reliability Improvement of Single-Shot Deviceanufacturing of components, assembly/integration, environmental testing (vibration, bump, temperature conditioning, water immersion, etc.) and functional tests under different operating conditions (ambient, high altitude and desert). After a thorough root-cause analysis based on the Fault Tree Analy
27#
發(fā)表于 2025-3-26 05:55:58 | 只看該作者
Reliability Evaluation of Silicon Carbide (SiC) Boost Converter Using Stochastic Modellthough it expands in all dimensions with full potential, the critical applications demand reliability from the safety point of view. So, efforts are being devoted towards the improvement of reliability of power electronic (PE) systems. Field experiences show that power electronic systems are usuall
28#
發(fā)表于 2025-3-26 11:54:54 | 只看該作者
29#
發(fā)表于 2025-3-26 15:55:49 | 只看該作者
Failure Mode Effect Analysis of Analog Alarm Trip Unit Using Simulation Techniqueentified and simulation was carried out to study the effects of component failures. Different modes of failure of each electronic component were considered. Component failures leading to safe and unsafe states of ATU were found out and documented. This study would help to identify unsafe failure mod
30#
發(fā)表于 2025-3-26 19:19:18 | 只看該作者
Ageing Model for Electrolytic Capacitors Under Thermal Overstressotection system of a nuclear reactor. These capacitors are frequently responsible for system failures. Ageing of the capacitor, influenced by operating thermal and electrical conditions, leads to failure, indicated by a change in capacitance and equivalent series resistance (ESR) beyond acceptable l
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