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Titlebook: Recent Advances in Reliability and Quality in Design; Hoang Pham Book 2008 Springer-Verlag London 2008 Engineering Maintenance.Engineering

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樓主: McKinley
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發(fā)表于 2025-3-25 05:32:41 | 只看該作者
22#
發(fā)表于 2025-3-25 08:26:32 | 只看該作者
Andres Folleco,Taghi M. Khoshgoftaar,Jason Van Hulse
23#
發(fā)表于 2025-3-25 15:10:15 | 只看該作者
24#
發(fā)表于 2025-3-25 16:14:15 | 只看該作者
Central Limit Theorem for a Family of Reliability Measuresduced in an earlier paper. This measure is derived from a marked point process where the base process is a random point process and the marks are fuzzy random variables. The underlying point process represents the locations where faults are located and the fuzzy marks quantify the subjective assessm
25#
發(fā)表于 2025-3-25 23:11:22 | 只看該作者
On Weighted Least Squares Estimation for the Parameters of Weibull Distributiondeling the phenomena of fatigue and life of many devices such as ball bearings, electric bulbs, capacitors, transistors, motors and automotive radiators. In recent years, a number of modifications of the traditional Weibull distribution have been proposed and applied to model complex failure data se
26#
發(fā)表于 2025-3-26 01:04:50 | 只看該作者
27#
發(fā)表于 2025-3-26 06:49:31 | 只看該作者
Some Alternative Approaches to System Reliability Modelingst decade. Part of the presented material is published for the first time. Another part which has already appeared or will appear in the coming months, now is presented in a newer, “simpler” way, as our teaching experience on that has grown during many professional discussions.
28#
發(fā)表于 2025-3-26 11:30:12 | 只看該作者
The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulationthe earlier failures of the products, burn-in testing has been widely used in electronic manufacturing as well as many other areas such as the military and aerospace industries since the 1950s. Burn-in has proven to be a very effective quality control procedure which can improve products’ quality, e
29#
發(fā)表于 2025-3-26 13:07:58 | 只看該作者
30#
發(fā)表于 2025-3-26 18:39:48 | 只看該作者
Weibull Data Analysis with Few or no Failuresin the reliability development phase. A good lab test will shorten the product development cycles and minimizes cost and part failures at the PG or field testing before the vehicle volume production. Appropriate testing is available to correlate test time in the lab (or lab test bogey) to the real w
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