Titlebook: Rapid Reliability Assessment of VLSICs; A. P. Dorey,B. K. Jones,Y. Z. Xu Book 1990 Plenum Press, New York 1990 CMOS.Modulation.VLSI.analog

Malaise

Conclusions,and have been proposed, we have described and used a set of tests which are sensitive to degradation of the circuit quality, are convenient to use, give results which can be readily interpreted and have potential for incorporation into an industrial environment using standard equipment.

ligature

978-1-4612-7879-5Plenum Press, New York 1990

concert

弄臟

Erythropoietin

外星人

有其法作用

Book 1990 measurements. Other work in the field is fully referenced at the end of each chapter. The team at Lancaster responsible for this book wish to thank the Alvey directorate and SERe for the necessary support and encouragement to publish our results. We would also like to thank John Henderson, recently

CLASP

ity of the measurements. Other work in the field is fully referenced at the end of each chapter. The team at Lancaster responsible for this book wish to thank the Alvey directorate and SERe for the necessary support and encouragement to publish our results. We would also like to thank John Henderson, recently978-1-4612-7879-5978-1-4613-0587-3

草率女

cuticle

A. P. Dorey,B. K. Jones,A. M. D. Richardson,Y. Z. Xually and cover basic concepts, relatively well established facts, lawlike and causal relations, theories, methods, standardized tests, biographic entries on significant figures, organizational profiles, indicat978-94-007-0753-5