Titlebook: Radiation Effects on Embedded Systems; RAOUL VELAZCO,PASCAL FOUILLAT,RICARDO REIS Book 2007 Springer Science+Business Media B.V. 2007 Radi

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Test Facilities for SEE and Dose Testing,the critical parameters that influences the devices degradation or malfunction will be given in order to show how the standards and guidelines deal with them. Then, the most widely used facilities will be described (particle accelerators, radioactive source…) and their domain of application defined.

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s.Simulation techniques of the transient effects of radiatio.Radiation Effects on Embedded Systems. .aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atm

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