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Titlebook: RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors; Keith A. Jenkins Book 2022 Springer Nature Switzerland AG 20

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樓主: clannish
11#
發(fā)表于 2025-3-23 11:36:50 | 只看該作者
12#
發(fā)表于 2025-3-23 16:01:59 | 只看該作者
to the Fermi surface and are indeed weakly interacting. Instead of trying to calculate their residual interactions microscopically, which would be a very difficult task, the interactions are parametrized. These parameters enter the expressions for different physical quantities and therefore can be d
13#
發(fā)表于 2025-3-23 19:14:04 | 只看該作者
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發(fā)表于 2025-3-24 00:37:05 | 只看該作者
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發(fā)表于 2025-3-24 06:25:48 | 只看該作者
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發(fā)表于 2025-3-24 07:20:46 | 只看該作者
Keith A. Jenkinsear future. This progress clearly shows that the contribution of electron crystallography is quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous
17#
發(fā)表于 2025-3-24 12:21:57 | 只看該作者
Keith A. Jenkinsbonding in order to establish a relation between atomic structure and properties. This includes also modification of the methods for structure analysis (automatic indexing, direct methods, measurement at low and high temperatures) and its application for solving more complex structure, e.g. metal-or
18#
發(fā)表于 2025-3-24 17:41:24 | 只看該作者
ear future. This progress clearly shows that the contribution of electron crystallography is quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous
19#
發(fā)表于 2025-3-24 22:37:12 | 只看該作者
ble. In addition to abstract concepts, the reader will learn of practical tips required to achieve meaningful measurements, and will understandthe relationship between these measurements and traditional, conventional DC characteristics.?.978-3-030-77777-7978-3-030-77775-3
20#
發(fā)表于 2025-3-25 02:19:32 | 只看該作者
Keith A. Jenkinsis quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous 978-1-4020-3919-5978-1-4020-3920-1Series ISSN 1568-2609
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