| 書(shū)目名稱 | Progress in Nanoscale Characterization and Manipulation |
| 編輯 | Rongming Wang,Chen Wang,Xuedong Bai |
| 視頻video | http://file.papertrans.cn/761/760609/760609.mp4 |
| 概述 | Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials research.Showcases recent advanc |
| 叢書(shū)名稱 | Springer Tracts in Modern Physics |
| 圖書(shū)封面 |  |
| 描述 | This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research..The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.. |
| 出版日期 | Book 2018 |
| 關(guān)鍵詞 | Electron/Ion Optics; Charged-particle microscopy; Scanning Electron Microscopy; Transmission Electron M |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-981-13-0454-5 |
| isbn_softcover | 978-981-13-4420-6 |
| isbn_ebook | 978-981-13-0454-5Series ISSN 0081-3869 Series E-ISSN 1615-0430 |
| issn_series | 0081-3869 |
| copyright | Peking University Press and Springer Nature Singapore Pte Ltd. 2018 |
|Archiver|手機(jī)版|小黑屋|
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