Titlebook: Proceedings of the XV Symposium Neuroradiologicum; Kumamoto, 25 Septemb Mutsumasa Takahashi (Chairmann),Yukunori Korogi (A Conference proce

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Landolt-B?rnstein: Numerical Data and Functional Relationships in Science and Technology - New Seriehttp://image.papertrans.cn/o/image/705339.jpg

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978-3-031-30235-0The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl

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A hybrid system for locating and recognizing low level graphic items, also in the presence of high noise, scaling, and rotation. This is accomplished by a hybrid model which performs graphic item location by morphological operations and connected component analysis, and item recognition by a proper connectionist model. Some very promising experimental results are reported to support the proposed algorithms.

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Conference proceedings 2024puting, artificial intelligence, signal and image processing, data science techniques, and their real-world applications. The papers are presented at International Conference on Power Engineering and Intelligent Systems (PEIS 2023), held during June 24–25, 2023, at National Institute of Technology Delhi, India..

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Wingham Rowanself is expensive and subject to dimensionality curse. Tensor train decomposition is designed to avoid the explosion of intermediary data, which plagues other tensor decomposition techniques. However, many tensor decomposition schemes, including tensor train decomposition is sensitive to noise in th

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M. A. Taylorts: SWARM (1995), PRIMER (1996–97), and ASIAEX (2000–01). In all three of these experiments, low frequency sound (50–600 Hz) was transmitted through strong coastal oceanographic features to array receivers. The differences and similarities of these experiments will be emphasized. In particular, we w

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Mary Jean Bowmanily introduce the large amounts of heavy metals required to generate optimized contrast and to render the final resin block conductive. Imaging of such samples by volume electron microscopy (EM) methods such as serial block face scanning electron microscopy (SBFSEM) or focused ion beam scanning elec