| 書目名稱 | Principles of Extreme Mechanics (XM) inDesign for Reliability (DfR) |
| 副標(biāo)題 | With Special Emphasi |
| 編輯 | Arief Suriadi Budiman |
| 視頻video | http://file.papertrans.cn/756/755591/755591.mp4 |
| 概述 | Presents the relation of mechanics in nanodevices and its effect on the performance reliability.Introduces a new and non-destructive method of probing stress which not many books would have addressed |
| 叢書名稱 | Engineering Materials |
| 圖書封面 |  |
| 描述 | .This book addresses issues pertinent to mechanics and stress generation, especially in recent?advanced cases of technology developments, spanning from micrometer interconnects in solar photovoltaics (PV), next-gen energy storage devices to multilayers of nano-scale composites enabling novel stretchable/flexible conductor technologies. In these cases, the mechanics of materials have been pushed to the extreme edges of human knowledge to enable cutting-edge, unprecedented functionalities and technological innovations. Synchrotron X-ray diffraction, in situ small-scale mechanical testing combined with physics-based computational modeling/simulation, has been widely used approaches to probe these mechanics of the materials at their extreme limits due to their recently discovered distinct advantages. The techniques discussed in this manuscript are highlights specially curated from the broad body of work recently reported in the literature, especially ones that the author had led thepursuits at the frontier himself. Extreme stress generation in these advanced material leads to often new failure modes, and hence, the reliability of the final product is directly affected. From the recent |
| 出版日期 | Book 2022 |
| 關(guān)鍵詞 | Micro Stress Generation; Synchrotron X-ray Diffraction; X-ray Micro-diffraction; Nano-device Reliabilit |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-981-15-6720-9 |
| isbn_softcover | 978-981-15-6722-3 |
| isbn_ebook | 978-981-15-6720-9Series ISSN 1612-1317 Series E-ISSN 1868-1212 |
| issn_series | 1612-1317 |
| copyright | The Editor(s) (if applicable) and The Author(s), under exclusive licence to Springer Nature Singapor |
|Archiver|手機(jī)版|小黑屋|
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