| 書目名稱 | Practical Scanning Electron Microscopy | | 副標題 | Electron and Ion Mic | | 編輯 | Joseph I. Goldstein,Harvey Yakowitz | | 視頻video | http://file.papertrans.cn/754/753253/753253.mp4 | | 圖書封面 |  | | 描述 | In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara- | | 出版日期 | Book 1975 | | 關鍵詞 | X-ray; bridge; electron microscope; electron microscopy; glass; instruments; iron; materials science; micros | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4613-4422-3 | | isbn_softcover | 978-1-4613-4424-7 | | isbn_ebook | 978-1-4613-4422-3 | | copyright | Plenum Press, New York 1975 |
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