| 書目名稱 | Power-Aware Testing and Test Strategies for Low Power Devices |
| 編輯 | Patrick Girard,Nicola Nicolici,Xiaoqing Wen |
| 視頻video | http://file.papertrans.cn/753/752719/752719.mp4 |
| 概述 | Is the only comprehensive book on power-aware test for (low power) circuits and systems.Instructs readers how low-power devices can be tested safely without affecting yield and reliability.Includes ne |
| 圖書封面 |  |
| 描述 | .Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.. |
| 出版日期 | Book 2010 |
| 關鍵詞 | Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4419-0928-2 |
| isbn_softcover | 978-1-4899-8313-8 |
| isbn_ebook | 978-1-4419-0928-2 |
| copyright | Springer-Verlag US 2010 |
|Archiver|手機版|小黑屋|
派博傳思國際
( 京公網安備110108008328)
GMT+8, 2025-10-14 04:44
發(fā)表于 2025-3-21 17:58:19
