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Titlebook: Polarization Effects in Semiconductors; From Ab Initio Theor Colin Wood,Debdeep Jena Book 2008 Springer-Verlag US 2008 Sensor.defects.desig

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書目名稱Polarization Effects in Semiconductors
副標題From Ab Initio Theor
編輯Colin Wood,Debdeep Jena
視頻videohttp://file.papertrans.cn/750/749762/749762.mp4
概述Describes in detail the broad reaching complexity and greatly increased design versatility allowed by polarization effects in high power electronic devices.Authored primarily by the physics, applied p
圖書封面Titlebook: Polarization Effects in Semiconductors; From Ab Initio Theor Colin Wood,Debdeep Jena Book 2008 Springer-Verlag US 2008 Sensor.defects.desig
描述.Polarization Effects in Semiconductors: From Ab Initio Theory to Device Applications. presents the latest understanding of the solid state physics, electronic implications and practical applications of the unique spontaneous or pyro-electric polarization charge of wurtzite compound semiconductors, and associated piezo-electric effects in strained thin film heterostructures.? These heterostructures are used in wide band gap semiconductor based sensors, in addition to various electronic and opto-electronic semiconductor devices....The book covers the ab initio theory of polarization in cubic and hexagonal semiconductors, growth of thin film GaN, GaN/AlGaN GaAlN/ AlGaInN, and other nitrides, and SiC heterostructures.? It discusses the effects of spontaneous and piezoelectric polarization on band diagrams and electronic properties of abrupt and compositionally graded heterostructures, electronic characterization of polarization-induced charge distributions by scanning-probe spectroscopies, and gauge factors and strain effects.? In addition, polarization in extended defects, piezo-electric strain/charge engineering, and application to device design and processing are covered. The effec
出版日期Book 2008
關鍵詞Sensor; defects; design; development; electrical engineering; field-effect transistor; material; microscopy
版次1
doihttps://doi.org/10.1007/978-0-387-68319-5
isbn_softcover978-1-4419-4228-9
isbn_ebook978-0-387-68319-5
copyrightSpringer-Verlag US 2008
The information of publication is updating

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