| 書目名稱 | Point Defects in Semiconductors and Insulators |
| 副標(biāo)題 | Determination of Ato |
| 編輯 | Johann-Martin Spaeth,Harald Overhof |
| 視頻video | http://file.papertrans.cn/750/749681/749681.mp4 |
| 概述 | Includes supplementary material: |
| 叢書名稱 | Springer Series in Materials Science |
| 圖書封面 |  |
| 描述 | The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap- peared about 10 years ago. Since then a very active development has oc- curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor- rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for "fundamental" studies in solid state physics. Therefore a more "pedestrian" access to the meth- ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc- tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the struc |
| 出版日期 | Book 2003 |
| 關(guān)鍵詞 | Density Functional Theory (DFT); Electrical Detection of EPR and ENDOR (EDEPR/EDENDOR); Electron Nucle |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-642-55615-9 |
| isbn_softcover | 978-3-642-62722-4 |
| isbn_ebook | 978-3-642-55615-9Series ISSN 0933-033X Series E-ISSN 2196-2812 |
| issn_series | 0933-033X |
| copyright | Springer-Verlag Berlin Heidelberg 2003 |
|Archiver|手機(jī)版|小黑屋|
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