| 書目名稱 | Physical Principles of Electron Microscopy |
| 副標題 | An Introduction to T |
| 編輯 | R.F. Egerton |
| 視頻video | http://file.papertrans.cn/747/746905/746905.mp4 |
| 概述 | Thoroughly revised and updated from the popular 2005 edition, this textbook introduces both the theory and current practice of electron microscopy.Contains expanded reference lists as a launch point i |
| 圖書封面 |  |
| 描述 | This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth..Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. .Physical Principles of Electron Microscopy, Second Edition., is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a c |
| 出版日期 | Textbook 2016Latest edition |
| 關鍵詞 | Electron Microscopy Textbook; X-ray Emission Spectroscopy; Electron Microscope; Analytical Electron Mic |
| 版次 | 2 |
| doi | https://doi.org/10.1007/978-3-319-39877-8 |
| isbn_softcover | 978-3-319-81986-0 |
| isbn_ebook | 978-3-319-39877-8 |
| copyright | Springer International Publishing Switzerland 2016 |
|Archiver|手機版|小黑屋|
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