Titlebook: On-line Error Detection and Fast Recover Techniques for Dependable Embedded Processors; Matthias Pflanz Book 2002 Springer-Verlag Berlin H

縱欲

Osteons

引水渠

Matthias Pflanznufacturing companies and design engineers are constantly trying to improve the performances of pumps by designing more ef cient pumps and by using the latest technologies available in terms of design software, new developed materials, and state of the art manufacturing tools. Today, computational u

ABYSS

朋黨派系

Introduction

2. Fault Models and Fault-Behavior of Processor Structures,nductor) transistor circuits, the silicon oxide is used as an insulation material and as the gate oxide. Therefore, . are a common reason for transistor failures. If the gate oxide is too thin, for instance, the transistor is susceptible to permanent gate damage by voltage peaks. Also, material poll

極為憤怒

accomplishment

On-line Error Detection and Fast Recover Techniques for Dependable Embedded Processors

噴油井

使饑餓