Titlebook: On-Line Testing for VLSI; Michael Nicolaidis,Yervan Zorian,Dhiraj K. Pradan Book 1998 Springer Science+Business Media New York 1998 ASIC.C

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課程

Design of Self-Testing Checkers for ,-out-of-, Codes Using Parallel Countersy Dimakopoulos et al. The checkers are built using a pair of parallel counters (composed of full-adders and half-adders) with a total of . inputs and a 2-rail STC. We show here how to build this type of checkers for a number of ./. codes for which previous methods failed.

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Alopecia-Areata

Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structurese and efficient built-in temperature sensors for the on-line thermal monitoring of microelectronics structures are introduced. The proposed temperature sensors produce a signal oscillating at a frequency proportional to the temperature of the microelectronics structure and therefore they are compati

喃喃而言

Clocked Dosimeter Compatible with Digital CMOS Technology These dosimeters are intended to be used as built-in sensors in integrated circuits to signal misfunction danger due to radiation exposure, and so they have a binary output which changes its state when the total radiation dose exceeds a prefixed level. The first circuit is an improved version of a

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Scalable Test Generators for High-Speed Datapath Circuitsable datapath circuits for which fast and complete fault coverage is required. Because of the presence of carry-lookahead, most existing BIST methods are unsuitable for these applications. High-level models are used to identify potential test sets for a small version of the circuit to be tested. The

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