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Titlebook: On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits; Rodrigo Possamai Bastos,Frank Sill Torres Book 2020 Sprin

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發(fā)表于 2025-3-21 19:01:32 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits
編輯Rodrigo Possamai Bastos,Frank Sill Torres
視頻videohttp://file.papertrans.cn/702/701312/701312.mp4
概述Presents a unique approach for detection of radiation-induced transient faults in integrated circuits.Describes the effects of ionizing particles in the transistor body and discusses its exploitation.
圖書封面Titlebook: On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits;  Rodrigo Possamai Bastos,Frank Sill Torres Book 2020 Sprin
描述.This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption.? The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs.?.
出版日期Book 2020
關(guān)鍵詞Soft errors; Fault-tolerant systems; Dependable embedded processors; Radiation-Induced Transient Faults
版次1
doihttps://doi.org/10.1007/978-3-030-29353-6
isbn_softcover978-3-030-29355-0
isbn_ebook978-3-030-29353-6
copyrightSpringer Nature Switzerland AG 2020
The information of publication is updating

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Effectiveness of Hardware-Level Techniques in Detecting Transient Faults,stems. These techniques mainly differ in their detection capabilities and in the constraints they impose on the system design. This chapter evaluates and compares different techniques regarding their effectivenesses in detecting transient faults arisen in combinational logic blocks, and resulting in soft errors (SEs).
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發(fā)表于 2025-3-22 14:07:20 | 只看該作者
Noise Robustness of Body Built-In Sensors,t Sensors that enable the detection of radiation induced transient faults. The analysis is based on extracted layout data, including the substrate profile and different kind of generic noise sources. Therefore, external as well as internal noise source are considered and acceptable noise level are presented.
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Architectures of Body Built-In Current Sensors for Detection of Transient Faults,d describes the different state-of-the-art BBICS architectures. Moreover, this chapter defines what we call as the reference sensitivity of a sensor (or a memory element) in detecting single transient faults, and it compare state-of-the-art BBICS architectures in terms of their sensitivity in detecting transient faults and area overhead.
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發(fā)表于 2025-3-23 04:29:08 | 只看該作者
Book 2020ns, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs.?.
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發(fā)表于 2025-3-23 08:43:29 | 只看該作者
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