Titlebook: Novel Algorithms for Fast Statistical Analysis of Scaled Circuits; Amith Singhee,Rob A. Rutenbar Book 2009 Springer Science+Business Media

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Statistical Blockade: Estimating Rare Event Statistics,cal, but due to manufacturing variations, they usually differ. Suppose we desire a . yield of 99%; that is, no more that one chip per 100 should fail. This means that on average, not more than (approx.) one per 100×1 million SRAM cells; that is 10 per billion, should fail. This translates to a requi

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Amith Singhee,Rob A. RutenbarPresents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applications.Applies theory from a wide variety of scientific fields (machine learning,

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Book 2009hine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime..

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Book 2009 the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast