Titlebook: Noncontact Atomic Force Microscopy; S. Morita,R. Wiesendanger,E. Meyer Book 2002 Springer-Verlag Berlin Heidelberg 2002 AFM.Bias.Helium-At

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Atomically Resolved Imaging of a NiO(001) Surface,lysis. The surface structure of metal oxides has thus been the subject of much investigation. However, the low conductivity inherent in metal oxides makes it difficult to measure surface structure using electron beams or by STM. NC-AFM provides atomically resolved images of semiconducting or conduct

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Atoms and Molecules on TiO2(110) and CeO2(111) Surfaces,lectrolysis, semiconductor or superconductor devices, etc. However, the oxide surfaces are, in general, heterogeneous and complicated. The inherent compositional and structural inhomogeneity of oxide surfaces makes it extremely difficult to identify the essential issues for their functions. Scanning

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NC-AFM Imaging of Adsorbed Molecules, sufficient resolution for imaging conductive samples at an atomic scale, an STM tip often has to penetrate poorly conducting samples such as thick organic films to sustain a tunneling current [.,.]. Deformation and damage of sample surfaces and even the motion of isolated molecules then occur durin

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Organic Molecular Films, is already on a submicron-scale and a simple extrapolation gives a size of 50 nm by the year 2011. Consequently, there has been growing interest in single-molecule electronics, where each individual molecule can be an electronic or optical device as an independent functional unit. One of the remark

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Chemical Interaction in NC-AFM on Semiconductor Surfaces, mode the tip oscillates at its eigenfrequency . and moves in and out of the interaction region during each oscillation cycle. Due to the tip—surface interaction the new eigenfrequency is modified by Δ. from the original eigenfrequency ... Experimentally, by keeping Δ. constant with feedback systems