Titlebook: Non-logic Devices in Logic Processes; Yanjun Ma,Edwin Kan Book 2017 Springer International Publishing AG 2017 Device Physics.Logic CMOS.MO

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Yanjun Ma,Edwin KanEnables readers to design less expensive integrated circuits, with higher yield, which reach the market faster.Covers a wide range of topics, including device physics, device designs and implementatio

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IntroductionIn this chapter, we provide a brief introduction and review the importance of semiconductor devices in supporting the whole electronics industry, the economics of semiconductor industry, the Moore’s law, and a number of corollaries that may be used to derive the best practices in designing devices for use in integrated circuits.

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Overview of Logic CMOS Processes from that of the core devices, is shown in parallel with the core devices. We also discussed the fabrication of native devices and potential use of spacer for charge storage—two features that will see use in later chapters. The basics of mask design, process monitoring, and wafer fabrication econom

Resection

Non-logic MOSFETs in Logic CMOS Processeseveral types of MOSFETs that have different threshold voltages than those provided by the foundries. In particular, the bandgap-engineered FETs have found wide use in voltage reference circuits. Then in Sect. 4.3 we discuss another important class of MOSFETs—LDMOS that can operate at voltage over 15

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Floating-Gate Devices in Logic CMOS Processeshat can be produced in logic CMOS processes. We describe some examples of making floating-gate memory cells in a?logic process and several methods of programming, including tunneling and hot carrier injection, floating-gate devices. The importance of coupling ratio and its implications to the NVM ce

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Logic Nonvolatile Memoryive an overview of the embedded NVM design using logic CMOS process. We review the basic memory cell design, the programming and erasing methods, and array structure of embedded NVMs. High-voltage circuits, including charge pumps and high-voltage switches, are also discussed. Reliability issues asso