Titlebook: Neural Models and Algorithms for Digital Testing; Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L Book 1991 Springer Science+Business M

浪蕩子

Neural Computers,ion to the test generation problem using a neurocomputer that contains special hardware to perform energy minimization for analog neural networks [4]. We also wrote a computer program on a SUN 3/50 workstation to simulate the network. Both results are in agreement and demonstrate the feasibility of our approach.

stress-response

Solving Graph Problems,he logic circuit. Each input vector provides one solution of the independent set problem. The independent set consists of only vertices with true encoding. This new methodology has the potential of solving the problem in real time if programmable logic is used [8].

Hla461

強制性

Quadratic 0-1 Programming,Once the test generation problem has been formulated as an optimization problem on a neural network, several methods can be used to find the minimum of the energy function.

Acumen

憤怒事實

Open Problems,The research reported in the proceeding chapters opens up a new line of thought relating test generation to general optimization problems. We hope the reader will be tempted to find solutions to other currently open problems including the ones listed below:

遺傳

infatuation

整潔

法律的瑕疵