Titlebook: Neural Models and Algorithms for Digital Testing; Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L Book 1991 Springer Science+Business M

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Solving Graph Problems,ided design. Our solution is based on a novel transformation of the graph to a logic circuit. The vertices in the graph are encoded with Boolean variables whose relationships are represented in the logic circuit. The transformation is derived from the energy relation of the neural network model of t

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Test Generation Reformulated,ch gate’s function in the circuit. Second, the signal in the fault-free and faulty circuits at the fault site must assume opposite values (e.g., 0 and 1 respectively, for a s-a-1 fault). Third, for the same primary input vector, the fault-free and faulty circuits should produce different output values.

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