| 書目名稱 | Nanoscale Phenomena in Ferroelectric Thin Films | | 編輯 | Seungbum Hong | | 視頻video | http://file.papertrans.cn/661/660947/660947.mp4 | | 叢書名稱 | Multifunctional Thin Film Series | | 圖書封面 |  | | 描述 | This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well- known le‘a(chǎn)dingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high- density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully rel | | 出版日期 | Book 2004 | | 關(guān)鍵詞 | adsorption; fatigue; film; German; nano-scale; platinum; silicon; Sorption; structure; surface; thermodynamics | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4419-9044-0 | | isbn_softcover | 978-1-4613-4771-2 | | isbn_ebook | 978-1-4419-9044-0 | | copyright | Springer Science+Business Media New York 2004 |
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