Titlebook: Nanoscale Characterisation of Ferroelectric Materials; Scanning Probe Micro Marin Alexe,Alexei Gruverman Book 2004 Springer-Verlag Berlin H

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https://doi.org/10.1007/978-3-662-08901-9AFM measurements; Ferroelectric memory; Helium-Atom-Streuung; Nano-fabrication; Nanosize ferroelectrics;

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Marin Alexe,Alexei GruvermanFirst one on nanoscale characterization of ferroelectric materials.Includes supplementary material:

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Electrical Characterization of Nanoscale Ferroelectric Structures,The present chapter focuses on the electrical characterization of small ferroelectric capacitors and the problems arising from going to smaller and smaller structure sizes. In particular, the electrical hysteresis loop is investigated as a key property of ferroelectric materials.

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Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces, of ferroelectric materials with various scanning probe microscopies (SPM) [l–3], many examples of which can be found in this text. The natures of the probe and contrast formation mechanisms in these techniques are vastly different; therefore, SPM images reflect different properties of ferroelectric surfaces.

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Challenges in the Analysis of the Local Piezoelectric Response,cal signal by the position sensitive detector of the SFM and extracted from the global deflection signal using a standard lock-in technique. This electrical signal representing the cantilever vibrations is further referred to as the . (PRS), for reasons that will be explained later.

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Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Polarization,he switchable dielectric polarization of ferroelectric material. To characterize such ferroelectric materials, a highresolution tool is required for observing the microscopic distribution of remanent (or spontaneous) polarization of ferroelectric materials.

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