Titlebook: Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms; Jozef Vesely Book 2017 Springer International Publishing AG 2017

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Book 2017 dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM

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David P. Johnson,Heather S. McLeanunbalanced parameters as the basis of and need for tiered SHM frameworks. Additional?basis is provided by?characterization of the non-contact sensors challenge into a twin issue of flutter and component certification. Finally, linkages are made between the tiered SHM framework as well as the use of a conceptual framework.

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Zheng Zhou,Mohammad Afhamisis,Maria Rita Palattella,Nicola Accettura,Pascal Berthoun Madrid, Spain in March 2014..The 45 revised full papers presented together with 4 invited talks were carefully reviewed and selected from 116 submissions. The papers cover the following topics: algebraic language theory; algorithms on automata and words; automata and logic; automata for system ana