Titlebook: Microstructural Analysis; Tools and Techniques James L. McCall,William M. Mueller (Director of Ed Book 1973 Plenum Press, New York 1973 all

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Scanning Electron Microscopy for Microstructural Analysis,y to produce a vast quantity of pretty pictures. In looking over the published technical literature of a few years ago, and even some of our own technical reports, it is obvious that SEM photographs were used in this way, and, quite frankly, frequently added nothing to the technical content of the p

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High Voltage Electron Microscopy for Microstructural Analysis,wing the R. C.A. microscopes, Hitachi 650 kV microscopes have been installed at Berkeley, Case Western Reserve University and Oak Ridge and a JEOL 1 MV microscope at the Hanford Laboratory in Richland, Washington; several other facilities are being built or planned. The most recent development in th

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Computers in Microstructural Analysis,rface requirements and a description of a flexible, modular approach to the whole question of using a computer in the laboratory. In particular, the advantages of using the rather inexpensive and easily programmable general purpose computer /interface systems now becoming available will be emphasize

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Ion Scattering Spectroscopy for Microstructural Analysis,h ISS, it is possible to determine not only the composition of the outermost atomic layer, but also the composition of successive deeper layers into the specimen. Thus, the composition as a function of depth, a depth profile, can be established. The realization of this technique was made possible by

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