Titlebook: Microelectronic Devices, Circuits and Systems; Third International V. Arunachalam,K. Sivasankaran Conference proceedings 2022 The Editor(s

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Kumar A. Shukla,Debangan Mandal,Ayush Thakur,Soham Adhikari,V. Vijayarajanstics, and cultural meanings. The developed method is also deployed to a field study in Phulenagar, an urban slum of Mumbai. Regions such as these, occupied by people of low socioeconomic stratum have rich sonic interactions because of small residences and proximity of residences. They also offer ri

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Shweta S. Patil,B. Srinivasa Varma,G. Devadasu,C. H. Hussaian Basha,M. J. R. Inamdar,S. S. Salmans. It covers the propagation of the system usage profile throughout the architecture, and the impact of the execution environment, which are neglected in most of the existing approaches. Before analysis, the model is automatically transformed into a formal Markov model in order to support effective

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A. V. Shreyas Madhav,A. K. Ilavarasi,Amit Kumar TyagiOM) and analyze the dependency between the MOM’s usage and its performance. We use statistical inference to conclude these dependencies from observations. For ActiveMQ 5.3, the resulting functions predict the performance with a relative mean square error 0.1.

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K. T. Kavyadevi,Apurva Saindane,T. VigneswaranOM) and analyze the dependency between the MOM’s usage and its performance. We use statistical inference to conclude these dependencies from observations. For ActiveMQ 5.3, the resulting functions predict the performance with a relative mean square error 0.1.

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S. Kannadhasan,R. Nagarajantrial management who are interested in the use of emerging technologies such as IOT, IIOT, Digital Twins, I4.0 etc. as well as new and emerging methods and tools to 978-981-13-5977-4Series ISSN 2190-3018 Series E-ISSN 2190-3026

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Shreya Atul Sharma,Abantee Gangopadhyay,K. T. Koushik,K. C. Sriharipriya,J. Christopher Clementtrial management who are interested in the use of emerging technologies such as IOT, IIOT, Digital Twins, I4.0 etc. as well as new and emerging methods and tools to 978-981-13-5977-4Series ISSN 2190-3018 Series E-ISSN 2190-3026