Titlebook: Microbeam and Nanobeam Analysis; Daniele Benoit,Jean-Francois Bresse,Johann Wernisc Conference proceedings 1996 Springer-Verlag Wien 1996

Intimidate

書目名稱Microbeam and Nanobeam Analysis影響因子(影響力)




書目名稱Microbeam and Nanobeam Analysis影響因子(影響力)學(xué)科排名




書目名稱Microbeam and Nanobeam Analysis網(wǎng)絡(luò)公開度




書目名稱Microbeam and Nanobeam Analysis網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Microbeam and Nanobeam Analysis被引頻次




書目名稱Microbeam and Nanobeam Analysis被引頻次學(xué)科排名




書目名稱Microbeam and Nanobeam Analysis年度引用




書目名稱Microbeam and Nanobeam Analysis年度引用學(xué)科排名




書目名稱Microbeam and Nanobeam Analysis讀者反饋




書目名稱Microbeam and Nanobeam Analysis讀者反饋學(xué)科排名

Spinal-Fusion

microscopic

Conspiracy

hyperuricemia

百靈鳥

theta-waves

https://doi.org/10.1007/978-3-7091-6555-3Absorption; Transmission; diffraction; electron microscope; electron microscopy; glass; imaging; microscopy

Phonophobia

妨礙議事

Cathodoluminescence Microscopy and Spectroscopy of Semiconductors and Wide Bandgap Insulating Materi pre-existing point defects and induced defects during the electron bombardment. Examples of CL microscopy and spectroscopy applied to the microcharacterisation of semiconductors (GaAs, InP and related materials) and of synthetic and natural mineral materials (ZnS, SiO., rare-earth bearing crystals)

Anthrp

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)olymers) will be reviewed and illustrated. Different applications coming mainly from our recent work will be treated with special emphasis on imaging. They concern surface composition and morphology of polymer blends, contamination and additives at polymer surfaces, plasma treated polymer surfaces a