Titlebook: Microanalysis of Solids; B. G. Yacobi,D. B. Holt,L. L. Kazmerski Book 1994 Springer Science+Business Media New York 1994 Photoemission spe

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ion on society and the relationship between religion and social change.* the links between belief, belonging and social identity.* contemporary Christianity and the religions of ethnic minorities in the West .* globalisation, religious pluralism and postmodernity.STEPHEN J. HUNT is Senior Lecturer i

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斷言

Auger Electron Spectroscopyr unambiguous identification of the composition. (3) One-, two-, and three-dimensional depth analysis (with approximately 5–50 ? depth resolution) can be performed using simultaneous sputter (ion) etching and other methods. These depth analysis modes provide for the identification of impurities at i

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Secondary Ion Mass Spectrometrypter will outline basic principles of the SIMS technique, the equipment used for the technique, and several closely related techniques (SIMS variants). Information which can be obtained by SIMS will be discussed and several examples presented.

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Microellipsometryeasurements. The major advantage of ellipsometry is that extremely thin films, down to average thicknesses of less than a single atomic monolayer, may be detected and measured. Furthermore, these measurements are nondestructive and can be performed ., permitting direct, real-time measurements of fil

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Scanning Acoustic Microscopyage relies on the origin of contrast in acoustic microscopy lying in the interaction of elastic waves with local variations in mechanical properties. Using an acoustic microscope it is therefore possible to study, with high resolution and sensitivity, mechanical properties of the specimen such as de

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Book 1994bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electron

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