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Titlebook: Me?- und Automatisierungstechnik; Technologien, Verfah Dietrich Ernst,Manfred Thoma Conference proceedings 1980 Springer-Verlag Berlin Heid

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樓主: NO610
21#
發(fā)表于 2025-3-25 05:30:01 | 只看該作者
Halbleitersensorens. Microprocessor compatible sensors have to deliver a digital or a simple convertible output signal, and their price should be compatible with integrated circuits. With sensors based on silicon for some physical parameters and resticted measurement ranges, these requirements can be fulfilled. As ex
22#
發(fā)表于 2025-3-25 07:55:44 | 只看該作者
23#
發(fā)表于 2025-3-25 14:16:57 | 只看該作者
Lichtleitersysteme der Mess- und Prozesstechnik, Aufbau und Erfahrungenctromagnetic interferences. After a brief discussion of the components and the requirements under severe environmental conditions some typical applications and bus configurations are presented..Experience in the optical communication system of the fault-tolerant RDC-System (Really Distributed Comput
24#
發(fā)表于 2025-3-25 19:38:18 | 只看該作者
25#
發(fā)表于 2025-3-25 22:41:07 | 只看該作者
Waagen als Datengeber und Industrielle W?gedatenverarbeitungg process. Second extended weighing systems equipped with mini computers and peripherals like display console, printer and keyboard. Third large process-control-systems are showed with modern display consoles. In this application the weighing system is only a part of the whole system and is monitore
26#
發(fā)表于 2025-3-26 02:11:43 | 只看該作者
27#
發(fā)表于 2025-3-26 07:19:49 | 只看該作者
28#
發(fā)表于 2025-3-26 11:36:49 | 只看該作者
29#
發(fā)表于 2025-3-26 14:49:03 | 只看該作者
Ein Modell zur Fahrzeug-Endkontrollelly automated and therefore objective..Those testing methods which at present are not able to be automated because the technology is not available will be made more reliable by giving the tester computer guidance.
30#
發(fā)表于 2025-3-26 18:04:35 | 只看該作者
Prozessrechnergesteuerte Serienprüfung und Prozessüberwachung im Automobilbaug of car-engines. By developing new measuring and testing procedures and relevant Softwaresystems and by utilizing modern computer and controlling technology, it has been possible to automatic serial testing to a high degree. In combination with new storage and transporting technologies, hierarchall
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