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Titlebook: Metallographic Specimen Preparation; Optical and Electron James L. McCall,William M. Mueller (Director of Ed Book 1974 Plenum Press, New Yo

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發(fā)表于 2025-3-21 18:19:40 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱(chēng)Metallographic Specimen Preparation
副標(biāo)題Optical and Electron
編輯James L. McCall,William M. Mueller (Director of Ed
視頻videohttp://file.papertrans.cn/632/631578/631578.mp4
圖書(shū)封面Titlebook: Metallographic Specimen Preparation; Optical and Electron James L. McCall,William M. Mueller (Director of Ed Book 1974 Plenum Press, New Yo
描述/.letallography is much more than taking striking pictures at high magnifications or polishing and etching specimens in such a way that no scratches can be seen. Basically, metallography is the physical metallurgist‘s most useful and most used tool for studying metals. Although it is perhaps his oldest tool, it certainly is not likely to become obsolete. Rather, the continued demands that have been placed upon materials have required more detailed charac- terizations of their microstructures and this, in turn, has re- quired the metallographer to develop new techniques to make these characterizations. Not too many years ago, the metallographer had only optical microscopes with which to examine his specimens. Now he has elec- tron microscopes, scanning electron microscopes, and a whole host of instruments which were unknown to him only a relatively few years ago. This has forced him to learn not only how to use these new instruments and how to interpret the information that they provide but it also has made him develop new techniques for preparing the samples for examination.
出版日期Book 1974
關(guān)鍵詞electron microscope; information; instruments; material; materials; metals; microstructure; microstructures
版次1
doihttps://doi.org/10.1007/978-1-4615-8708-8
isbn_softcover978-1-4615-8710-1
isbn_ebook978-1-4615-8708-8
copyrightPlenum Press, New York 1974
The information of publication is updating

書(shū)目名稱(chēng)Metallographic Specimen Preparation影響因子(影響力)




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發(fā)表于 2025-3-21 20:29:46 | 只看該作者
The Use of Wire Saws for Metallographic Sectioning, little consequence. However, on many materials, such as semiconductors, this damage cannot be tolerated. Hairline cracks and craze caused by forceful cutting must be polished out before the material may be examined with the microscope.
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發(fā)表于 2025-3-22 03:43:18 | 只看該作者
Techniques of Specimen Preparation for Metallography Using a New and Unique Automated Polishing Prorelatively insensitive to the material polished so that no special polishing “recipes” were required. Results are consistent, predictable and largely independent of operator factors, such as level of skill, experience or motivation. Polishing by this method is very fast; the polishing time is generally under 10 minutes total.
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Abrasive Cutting in Metallography,he quality of the cut surface obtained is usually superior to that obtained by other means and fewer subsequent steps may be required. Metal core diamond blades fulfill the demanding requirements of specialized applications such as ceramics, rocks, very hard metallics and printed circuit boards.
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發(fā)表于 2025-3-22 17:58:03 | 只看該作者
Mounting, Lapping and Polishing Large Sizes and Quantities of Metallographic Specimens,als on a variety of cloths. Although, through the years, methods, materials and equipment gradually improved, there were limitations, particularly in the mounting of large size specimens, the heat and pressure to be used, and the ability to impregnate porous samples.
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發(fā)表于 2025-3-23 00:12:44 | 只看該作者
Magnetic Etching with Ferrofluid,materials have atoms with one or more unpaired electrons that produce a net magnetic moment. Materials exhibiting strong magnetism are classified as .; other materials displaying significant magnetism are classified as .. Materials showing weak magnetic response are . and materials having no net magnetism are . (diamagnetic).
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