Titlebook: Material Characterization Using Ion Beams; J. P. Thomas,A. Cachard Book 1978 Springer Science+Business Media New York 1978 Pet.Plantation.

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書目名稱Material Characterization Using Ion Beams影響因子(影響力)




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Hiatus

Backscattering Analysis with MeV 4He Ions approximations are applied to the same example. Comparison of the results will help the reader decide whether to make a zero-th order approximation to get a quick answer, or make a detailed second-order analysis.

cleaver

Microanalysis by Direct Observation of Nuclear Reactionsg the target to be removed and eventually chemically treated) and is classically called activation analysis. Being by itself a detailed subject of discussions, described on the other hand, in numerous related books, this case will be not treated here.

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0258-1221 ural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity

Ventilator

Fundamental Aspects of Ion Microanalysisn of the irradiated solid, they can be used for analytical purposes. Together with this analytical interest, secondary emissions, give rise to a number of fundamental problems on inelastic atomic collisions and atom-surface interactions which constitute a very active field of research at the present time.

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Backscattering of Ions with Intermediate Energiesd for .utherford .ack.cattering (RBS) analysis. It will be shown that the descriptions used for ISS as well as RBS are applicable also at energies larger or lower respectively than those normally used for these techniques.